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Leader in Integrated ICT Hardware & Systems

Russell Duane -

  • IPES
Dr. Duane has worked on a number of research projects in collaboration with industrial partners and has acted as a consultant in the area of semiconductor devices for a number of indigenous and multinational companies. He has been issued three U.S. patents in the area of semiconductor devices. Two of these patents were the outcome of an industrial collaboration with Bourns to investigate new over-voltage protection devices. Another patent on a novel memory device was issued as a result of his Ph.D. work. 
Dr. Duane currently leads an SFI funded research programme in the area of dielectric charging for MEMS devices. One of the papers from this programme was chosen last year by the Editors of Applied Physics Letters to be included in special edition Editor's Choice 2012 which represents the best research across the entire journal. He is also currently responsible for improving the performance of the Tyndall RADFET technology and has already significantly increased production yield and is currently investigating two novel device structures to increase sensitivity. He has published a number of articles in refereed journals and conference proceedings.

 

Research Grants

Funder Start Date End Date Title Role
Foreign Industry 01-MAR-06 31-DEC-06 Littlefuse - New Product Development Principal Investigator
Enterprise Irl 15-DEC-07 15-DEC-08 EI Yield Enhancement Silicon overvoltage/overcurrent technology for ultra-low voltage mediam speed Principal Investigator
European Union 01-JAN-04 31-DEC-06 [EU Contract No. 506844]{Duane Dr. R} V Principal Investigator
Science Foundation of Ireland 01-JUL-10 31-DEC-15 SFI 10/RFP/ECE2883 ; Study of Dielectric Charging in Capactive MEMS Swtiches Principal Investigator
Irish Research Council for Science, Engineering & Technology (IRCSET) 01-JUL-10 01-JUN-13 Dielectric charging in capacitive MEMS devices in irradiating environment. Principal Investigator
Enterprise Irl 01-JUL-02 30-JUN-04 [IF/2002/022]{Dr.Russell Duane} N Principal Investigator
Irish Research Council for Science, Engineering & Technology (IRCSET) 01-OCT-02 30-SEP-05 [IRCSET SC/02/198] {Duane, Dr.R.} N Principal Investigator
Enterprise Irl 02-MAY-07 02-JUL-08 EI PC/2007/006 Principal Investigator

Peer Reviewed Journals

YearJournalPublication
2014Applied Physics LettersA simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches
Ryan, C,Olszewski, Z,Houlihan, R,O'Mahony, C,Duane, R (2014) A simple electrical test method to isolate viscoelasticity and creep in capacitive microelectromechanical switches. : . [Details]
2013Lab On A ChipRadiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals
Arima, V,Pascali, G,Lade, O,Kretschmer, HR,Bernsdorf, I,Hammond, V,Watts, P,De Leonardis, F,Tarn, MD,Pamme, N,Cvetkovic, BZ,Dittrich, PS,Vasovic, N,Duane, R,Jaksic, A,Zacheo, A,Zizzari, A,Marra, L,Perrone, E,Salvadori, PA,Rinaldi, R (2013) Radiochemistry on chip: towards dose-on-demand synthesis of PET radiopharmaceuticals. : . [Details]
2012Applied Physics LettersExperimental isolation of degradation mechanisms in capacitive microelectromechanical switches
Olszewski, Z,Houlihan, R,Ryan, C,O'Mahony, C,Duane, R (2012) Experimental isolation of degradation mechanisms in capacitive microelectromechanical switches. : . [Details]
2012Applied Physics LettersAddendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)]
Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R. (2012) Addendum:“A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches”[Appl. Phys. Lett. 93, 094101 (2008)]. : .
2011Microelectronics ReliabilityThermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C
O'Mahony, D; Duane, R; Campagno, T; Lewis, L; Cordero, N; Maaskant, P; Waldron, F; Corbett, B (2011) Thermal stability of SiC Schottky diode anode and cathode metalisations after 1000 h at 350 degrees C. : . [Details]
2010IEEE Transactions On Electron DevicesLDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide
Yan, R,Duane, R,Razavi, P,Afzalian, A,Ferain, I,Lee, CW,Akhavan, ND,Nguyen, BY,Bourdelle, KK,Colinge, JP; (2010) LDD and Back-Gate Engineering for Fully Depleted Planar SOI Transistors with Thin Buried Oxide. : . [Details]
2009Applied Physics LettersComment on "Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches" [Appl. Phys. Lett. 92, 043502 (2008)]
Olszewski, Z.,O'Mahony, C.,Houlihan, R.,Duane, R. (2009) Comment on "Comparison of air breakdown and substrate injection as mechanisms to induce dielectric charging in microelectromechanical switches" [Appl. Phys. Lett. 92, 043502 (2008)]. : .
2008Applied Physics LettersA study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches
Olszewski, Z.,Duane, R.,O'Mahony, C. (2008) A study of capacitance-voltage curve narrowing effect in capacitive microelectromechanical switches. : .
2007IEEE Electron Device LettersIntrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor
Duane, R,Rafhay, Q,Beug, MF,van Duuren, M; (2007) Intrinsic mismatch between floating-gate nonvolatile memory cell and equivalent transistor. : . [Details]
2007Biosensors & BioelectronicsInvestigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor
Lillis, B,Manning, M,Hurley, E,Berney, H,Duane, R,Mathewson, A,Sheehan, MM; (2007) Investigation into the effect that probe immobilisation method type has on the analytical signal of an EIS DNA biosensor. : . [Details]
2007IEEE Journal of Solid-State CircuitsMeasurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device
Cheng, X,Duane, R; (2007) Measurement and. analysis of PD-SOI static latches based on bistable-gated-bipolar device. : . [Details]
2007Biosensors & BioelectronicsInvestigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor
Lillis, B, Manning, M, Hurley, E, Berney, H, Duane, R, Mathewson, A, Sheehan, MM; (2007) Investigation Into The Effect That Probe Immobilisation Method Type Has On The Analytical Signal of An Eis Dna Biosensor. : . [Details]
2007IEEE Electron Device LettersIntrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor
Duane, R, Rafhay, Q, Beug, MF, van Duuren, M; (2007) Intrinsic Mismatch Between Floating-Gate Nonvolatile Memory Cell and Equivalent Transistor. : . [Details]
2007Solid-State ElectronicsExtraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods
Rafhay, Q,Beug, MF,Duane, R (2007) Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods. : . [Details]
2006Electronic Letters0.6V D flip-flop utilising negative differential resistance device
Cheng, X,Duane, R; (2006) 0.6V D flip-flop utilising negative differential resistance device. : . [Details]
2006IEEE Transactions On Electron DevicesA Comprehensive Study of Bistable Gated Bipolar Device
Cheng, X, Duane, R; (2006) A Comprehensive Study of Bistable Gated Bipolar Device. : . [Details]
2005Journal of Micromechanics and MicroengineeringCharacterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC)
Olszewski, Z.,Hilll, M.,O'Mahony, C.,Duane, R.,Houlihan, R. (2005) Characterization, modelling and performance evaluation of CMOS integrated multielectrode tunable capacitor (MTC). : .
2005Electronics LettersLow-voltage micromechanical test structures for measurement of residual charge in dielectrics
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2005) Low-voltage micromechanical test structures for measurement of residual charge in dielectrics. : .
2003Journal of Micromechanics and MicroengineeringAnalysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2003) Analysis of electromechanical boundary effects on the pull-in of micromachined fixed–fixed beams. : .
2003IEEE Transactions on Semiconductor ManufacturingImproving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size
MacSweeney, D,McCarthy, KG,Floyd, L,Duane, R,Hurley, P,Power, JA,Kelly, SC,Mathewson, A (2003) Improving the accuracy and efficiency of junction capacitance characterization: Strategies for probing configuration and data set size. : . [Details]
2003IEEE Electron Device LettersBistable gated bipolar device
Duane, R,Mathewson, A,Concannon, A; (2003) Bistable gated bipolar device. : . [Details]
2003IEEE Transactions on Semiconductor ManufacturingCompact Model Development for a New Non-Volatile Memory Cell Architecture
O'Shea,M.; Duane,R.; McCarthy,D.; McCarthy,K.G.; Concannon,A.; Mathewson,A.; (2003) Compact Model Development for a New Non-Volatile Memory Cell Architecture. : .
2003IEEE Transactions on Semiconductor ManufacturingImproving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size
MacSweeney,D.; McCarthy,K.G.; Floyd,L.; Duane,R.; Hurley, P.; Power, J.A.; Kelly, S.C.; Mathewson, A.; (2003) Improving the Accuracy and Efficiency of Junction Capacitance Characterization: Strategies for Probing Configuration and Data Set Size. : .
2003IEEE Transactions On Electron DevicesA novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications
Mc Carthy, D., Duane, R., O'Shea, M., Duffy, R., Mc Carthy, K., Kelliher, A.-M., Concannon, A., Mathewson, A. (2003) A novel CMOS-compatible top-floating-gate EEPROM cell for embedded applications. : .
2003Journal of Micromechanics and MicroengineeringAnalysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams
O'Mahony, C,Hill, M,Duane, R,Mathewson, A (2003) Analysis of electromechanical boundary effects on the pull-in of micromachined fixed-fixed beams. : .
2003Measurement Science &TechnologyCharacterization of micromechanical structures using white-light interferometry
O'Mahony, C,Hill, M,Brunet, M,Duane, R,Mathewson, A (2003) Characterization of micromechanical structures using white-light interferometry. : .
2003Journal of Micromechanics and MicroengineeringPerformance and reliability of post-CMOS metal/oxide MEMS for RF application
Hill, M,O' Mahony, C,Duane, R,Mathewson, A (2003) Performance and reliability of post-CMOS metal/oxide MEMS for RF application. : .
2000Microelectronics and ReliabilityDesign for Reliability
Minehane,S.; Duane,R.; O'Sullivan,P.; McCarthy,K.G.; Mathewson,A.; (2000) Design for Reliability. : .
2000Microelectronics ReliabilityDesign for reliability
Minehane, S,Duane, R,O'Sullivan, P,McCarthy, KG,Mathewson, A (2000) Design for reliability. : .
1999Microelectronic EngineeringModelling and simulation of reliability for design
Mathewson, A,O'Sullivan, P,Concannon, A,Foley, S,Minehane, S,Duane, R,Palser, K (1999) Modelling and simulation of reliability for design. : .
1998Microelectronics and ReliabilityDependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection
Martin, A,Duane, R,O'Sullivan, P,Mathewson, A (1998) Dependence of gate oxide breakdown on initial charge trapping under Fowler-Nordheim injection. : .

Conference Publications

YearPublication
2014MEMSWAVE
Ryan, C.,Olszewski, O. Z.,Houlihan, R.,O'Mahony, C.,Blake, A.,Duane, R. (2014) MEMSWAVE. : .
20149th ESA Round Table on MNT for Space Applications
Houlihan, R.,Duane, R.,Ryan, C.,O'Mahony, C.,Olszewski, O. Z. (2014) 9th ESA Round Table on MNT for Space Applications. : .
2013Micromechanics Europe 2013
Ryan, C.,Olszewski, Z.,Houlihan, R.,O’Mahony, C.,Duane, R. (2013) Micromechanics Europe 2013. : .
20128th ESA Round-Table on MNT for Space Applications,
Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C. ,Ryan, C. ,Duane, R. (2012) 8th ESA Round-Table on MNT for Space Applications,. : .
2012Royal Irish Academy Communications and Radio Science Colloquium
Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Duane, R. (2012) Royal Irish Academy Communications and Radio Science Colloquium. : .
2012RAD2012: The First International Conference on Radiation and Dosimetry in Various Fields of Research
Ryan, C. ,Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Duane, R. (2012) RAD2012: The First International Conference on Radiation and Dosimetry in Various Fields of Research. : .
2012Design, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2012
Olszewski, O. Z. ,Houlihan, R. ,O'Mahony, C.,Ryan, C. ,Duane, R. (2012) Design, Test, Integration and Packaging of MEMS/MOEMS - DTIP 2012. : .
20107th ESA Round Table on MNT for Space Applications
Olszewski, Z.,O'Mahony, C.,Houlihan, R.,Duane, R. (2010) 7th ESA Round Table on MNT for Space Applications. : .
2009Micromechanics Europe 2009
Houlihan, R.,Olszewski, O. Z.,Duane, R.,O'Mahony, C.,Collins, P.,Mathewson, A. (2009) Micromechanics Europe 2009. : .
2008Intel Ireland Research Conference
Olszewski, O. Z.,Duane, R.,O'Mahony, C. (2008) Intel Ireland Research Conference. : .
2008MEMSWAVE 2008
Olszewski, O. Z.,Duane, R.,O'Mahony, C. (2008) MEMSWAVE 2008. : .
2007MicroNanoReliability 2007
Olszewski, O. Z.,O'Mahony, C.,Duane, R.,Hill, M. (2007) MicroNanoReliability 2007. : .
2005Intel Ireland Research Conference
Olszewski, O. Z.,O'Mahony, C.,Duane, R. (2005) Intel Ireland Research Conference. : .
2004IEEE Design, Test, Integration and Packaging of MEMS (DTIP) 2004
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2004) IEEE Design, Test, Integration and Packaging of MEMS (DTIP) 2004. : .
2004Workshop on Dielectrics in Microelectronics
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2004) Workshop on Dielectrics in Microelectronics. : .
2004Micromechanics Europe 2004
O'Mahony, C.,Duane, R.,Hill, M.,Mathewson, A. (2004) Micromechanics Europe 2004. : .
2004Micromechanics Europe 2004
Olszewski, O. Z.,Hill, M.,O'Mahony, C.,Duane, R. (2004) Micromechanics Europe 2004. : .
2003Proceedings of SPIE - The International Society for Optical Engineering
Mathewson, A.; Duane, R.; Wrixon, G. T.; (2003) Proceedings of SPIE - The International Society for Optical Engineering. : .
2003Micromechanics Europe 2003
O'Mahony, C.,Hill, M.,Duane, R.,Kelleher, AM,Mathewson, A. (2003) Micromechanics Europe 2003. : .
2002International Conference on Microelectronic Test Structures (ICMTS 2002)
McCarthy,D.; O’Shea,M.; Duane,R. McCarthy,K.G.; Concannon,A,; Mathewson,A.; (2002) International Conference on Microelectronic Test Structures (ICMTS 2002). : .
2002International Conference on Microelectronic Test Structures (ICMTS 2002)
O'Shea,M.; McCarthy,D.; Duane,R.; McCarthy,K.G.; Concannon,A.; Mathewson,A.; (2002) International Conference on Microelectronic Test Structures (ICMTS 2002). : .
2002MIGAS Summer School 2002
O'Mahony, C.,Hill, M.,Duane, R.,Mathewson, A. (2002) MIGAS Summer School 2002. : .

Patents

  • [2001] 6310799 - A negative resistance device
  • [2003] 6,639,253 - overvoltage protection device
  • [2003] 6,603,155 - overvoltage protection device

Journal Activities

  • IEEE Transactions on Electron Devices - Referee
  • IEEE Electron Device Letters - Referee
  • J Appl Phys - Referee

Other Professional Activities

Reviewer of proposals in the area of flash memory for Flemish government.

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